Miyazaki Seiichi

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飛行時間測定法を用いた中速イオン散乱法の開発と半導体プロセス評価への応用

Creator	Yokoyama Shin \| Hirose Masataka \| Miyazaki Seiichi \| 桜田勇蔵
Journal
Date of Issued

New theory of effective work functions at metal/high-k dielectric interfaces : application to metal/high-k HfO2 and la2O 3 dielectric interfaces

Creator	Shiraishi Kenji \| Nakayama Takashi \| Akasaka Yasushi \| Miyazaki Seiichi \| Nakaoka Takashi \| Ohmori Kenji \| Ahmet Parhat \| Torii Kazuyoshi \| Watanabe Heiji \| Chikyow Toyohiro \| Nara Yasuo \| Iwai Hiroshi \| Yamada Keisaku
Journal	ECS Transactions Volume 2 Issue 1 pp. 25 - 40
Date of Issued	published_at 2006

Characterization of Electronic Charged States of Si-Based Quantum Dots and Their Application to Floating Gate Memories

Creator	Miyazaki Seiichi \| Ikeda Mitsuhisa \| Makihara Katsunori
Journal	ECS Transactions Volume 2 Issue 1 pp. 157 - 164
Date of Issued	published_at 2006

Depth Profiling of Chemical and Electronic Structures and Defects of Ultrathin HfSiON on Si(100)

Creator	Miyazaki Seiichi \| Ohta Akio \| Inumiya Seiji \| Nara Yasuo \| Yamada Keisaku
Journal	ECS Transactions Volume 3 Issue 3 pp. 171 - 180
Date of Issued	published_at 2006