Hard X-ray photoemission spectroscopy: variable depth analysis of bulk, surface and interface electronic properties
Surface Science 606 巻 3-4 号
125-129 頁
2011-11 発行
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SurSci_606_125.pdf
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種類 :
全文
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タイトル ( eng ) |
Hard X-ray photoemission spectroscopy: variable depth analysis of bulk, surface and interface electronic properties
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作成者 |
Panaccione Giancarlo
Kobayashi Keisuke
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収録物名 |
Surface Science
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巻 | 606 |
号 | 3-4 |
開始ページ | 125 |
終了ページ | 129 |
抄録 |
The electronic properties of surfaces and buried interfaces can vary considerably in comparison to the bulk. In turn, analyzing bulk properties, without including those of the surface, is understandably challenging. Hard X-ray photoelectron spectroscopy (HAXPES) allows the well known ability of photoemission to interrogate the electronic structure of material systems with bulk volume sensitivity. This is achieved by tuning the kinetic energy range of the analyzed photoelectrons in the multi-keV regime. This unique ability to probe truly bulk properties strongly compliments normal photoemission, which generally probes surface electronic structure that is different than the bulk selected examples of HAXPES and possible implications towards the study of complex oxide-based interfaces and highly correlated systems are discussed.
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著者キーワード |
Hard X-ray Photoelectron Spectroscopy
Bulk properties
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内容記述 |
This work has been supported in part by CNR-INFM. The research leading to these results has received funding from the FP72007-2013 framework programme under grant NMP3-LA-2010-246102. Development of HARP Lab systems has been supported by SENTAN, JST.
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NDC分類 |
物理学 [ 420 ]
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言語 |
英語
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資源タイプ | 学術雑誌論文 |
出版者 |
Elsevier B.V.
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発行日 | 2011-11 |
権利情報 |
Copyright (c) 2011 Elsevier B.V.
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
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出版タイプ | Author’s Original(十分な品質であるとして、著者から正式な査読に提出される版) |
アクセス権 | オープンアクセス |
収録物識別子 |
[ISSN] 0039-6028
[NCID] AA00853803
[DOI] 10.1016/j.susc.2011.10.022
[DOI] https://doi.org/10.1016/j.susc.2011.10.022
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