Hard X-ray photoemission spectroscopy: variable depth analysis of bulk, surface and interface electronic properties
Surface Science Volume 606 Issue 3-4
Page 125-129
published_at 2011-11
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| File | |
| Title ( eng ) |
Hard X-ray photoemission spectroscopy: variable depth analysis of bulk, surface and interface electronic properties
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| Creator |
Panaccione Giancarlo
Kobayashi Keisuke
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| Source Title |
Surface Science
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| Volume | 606 |
| Issue | 3-4 |
| Start Page | 125 |
| End Page | 129 |
| Abstract |
The electronic properties of surfaces and buried interfaces can vary considerably in comparison to the bulk. In turn, analyzing bulk properties, without including those of the surface, is understandably challenging. Hard X-ray photoelectron spectroscopy (HAXPES) allows the well known ability of photoemission to interrogate the electronic structure of material systems with bulk volume sensitivity. This is achieved by tuning the kinetic energy range of the analyzed photoelectrons in the multi-keV regime. This unique ability to probe truly bulk properties strongly compliments normal photoemission, which generally probes surface electronic structure that is different than the bulk selected examples of HAXPES and possible implications towards the study of complex oxide-based interfaces and highly correlated systems are discussed.
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| Keywords |
Hard X-ray Photoelectron Spectroscopy
Bulk properties
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| Descriptions |
This work has been supported in part by CNR-INFM. The research leading to these results has received funding from the FP72007-2013 framework programme under grant NMP3-LA-2010-246102. Development of HARP Lab systems has been supported by SENTAN, JST.
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| NDC |
Physics [ 420 ]
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| Language |
eng
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| Resource Type | journal article |
| Publisher |
Elsevier B.V.
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| Date of Issued | 2011-11 |
| Rights |
Copyright (c) 2011 Elsevier B.V.
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
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| Publish Type | Author’s Original |
| Access Rights | open access |
| Source Identifier |
[ISSN] 0039-6028
[NCID] AA00853803
[DOI] 10.1016/j.susc.2011.10.022
[DOI] https://doi.org/10.1016/j.susc.2011.10.022
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