Temperature Dependence of Half Flux Quantum in YBa2Cu3O7−y Tricrystal Thin Film Observed by Scanning SQUID Microscopy
Physica C: Superconductivity 367 巻 1-4 号
28-32 頁
2002-02-15 発行
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PhysicaC_367_28.pdf
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全文
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タイトル ( eng ) |
Temperature Dependence of Half Flux Quantum in YBa2Cu3O7−y Tricrystal Thin Film Observed by Scanning SQUID Microscopy
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作成者 |
Yamaguchi Tetsuji
Iguchi Ienari
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収録物名 |
Physica C: Superconductivity
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巻 | 367 |
号 | 1-4 |
開始ページ | 28 |
終了ページ | 32 |
抄録 |
One of the most important topics in high critical temperature superconductors is the symmetry of order parameter. The most powerful and direct method to show the evidence of d-wave symmetry is the measurement of the half flux quantum at the tricrystal boundary of a superconducting thin film. We present the observation of the half flux quantum in a YBa2Cu3O7−y thin film on a SrTiO3 tricrystal substrate by using a scanning SQUID microscope (SSM). The SSM observation is done from 3 to 90 K. The vortex at the tricrystal point corresponds to Φ0∫2(=1.03×10^-15Wb) and this half vortex is observable up to near the critical temperature. The results indicate the evidence of dx2−y2 symmetry of the superconducting order parameter. Josephson vortices at grain boundaries are also observable and some of them are mobile with increasing the temperature.
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著者キーワード |
Scanning SQUID microscope
half vortex
d-Wave pairing symmetry
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内容記述 |
This work has been supported by Core Research for Evolutional Science and Technology (CREST) of the Japan Science and Technology Corporation (JST).
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NDC分類 |
物理学 [ 420 ]
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言語 |
英語
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資源タイプ | 学術雑誌論文 |
出版者 |
Elsevier Science B.V.
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発行日 | 2002-02-15 |
権利情報 |
Copyright (c) 2002. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
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出版タイプ | Author’s Original(十分な品質であるとして、著者から正式な査読に提出される版) |
アクセス権 | オープンアクセス |
収録物識別子 |
[ISSN] 0921-4534
[NCID] AA11461984
[DOI] 10.1016/S0921-4534(01)00982-0
[DOI] https://doi.org/10.1016/S0921-4534(01)00982-0
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