Temperature Dependence of Half Flux Quantum in YBa2Cu3O7−y Tricrystal Thin Film Observed by Scanning SQUID Microscopy
Physica C: Superconductivity Volume 367 Issue 1-4
Page 28-32
published_at 2002-02-15
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Title ( eng ) |
Temperature Dependence of Half Flux Quantum in YBa2Cu3O7−y Tricrystal Thin Film Observed by Scanning SQUID Microscopy
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Creator |
Yamaguchi Tetsuji
Iguchi Ienari
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Source Title |
Physica C: Superconductivity
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Volume | 367 |
Issue | 1-4 |
Start Page | 28 |
End Page | 32 |
Abstract |
One of the most important topics in high critical temperature superconductors is the symmetry of order parameter. The most powerful and direct method to show the evidence of d-wave symmetry is the measurement of the half flux quantum at the tricrystal boundary of a superconducting thin film. We present the observation of the half flux quantum in a YBa2Cu3O7−y thin film on a SrTiO3 tricrystal substrate by using a scanning SQUID microscope (SSM). The SSM observation is done from 3 to 90 K. The vortex at the tricrystal point corresponds to Φ0∫2(=1.03×10^-15Wb) and this half vortex is observable up to near the critical temperature. The results indicate the evidence of dx2−y2 symmetry of the superconducting order parameter. Josephson vortices at grain boundaries are also observable and some of them are mobile with increasing the temperature.
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Keywords |
Scanning SQUID microscope
half vortex
d-Wave pairing symmetry
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Descriptions |
This work has been supported by Core Research for Evolutional Science and Technology (CREST) of the Japan Science and Technology Corporation (JST).
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NDC |
Physics [ 420 ]
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Language |
eng
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Resource Type | journal article |
Publisher |
Elsevier Science B.V.
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Date of Issued | 2002-02-15 |
Rights |
Copyright (c) 2002. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
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Publish Type | Author’s Original |
Access Rights | open access |
Source Identifier |
[ISSN] 0921-4534
[NCID] AA11461984
[DOI] 10.1016/S0921-4534(01)00982-0
[DOI] https://doi.org/10.1016/S0921-4534(01)00982-0
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