テスト不安とワーキングメモリの関係及び 筆記を用いた介入に関する研究動向

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Title ( jpn )
テスト不安とワーキングメモリの関係及び 筆記を用いた介入に関する研究動向
Title ( eng )
The Relationship Between Test Anxiety, Working Memory and Expressive Writing Interventions
Creator
Noritake Yoshihide
Source Title
広島大学大学院教育学研究科紀要. 第三部, 教育人間科学関連領域
Bulletin of the Graduate School of Education, Hiroshima University. Part 3, Education and human science
Issue 67
Start Page 201
End Page 209
Abstract
This paper reviewed the resent research about the behavioral and cognitive effects of negative emotions on performance. The relationship between negative emotions (e.g., test anxiety, pressure-induced worry, and stereotype threat), working memory, emotional regulation, and short expressive writing interventions was considered. The following suggestions were acquired: (1) negative emotions temporarily decrease the capacity of working memory to affect the task performances during the test situations; (2) maladaptive emotional regulation decreases working memory capacity; (3) reappraisal is an adaptive and effective emotional regulation strategy for handling negative emotions in testing situations; and (4) short expressive writing facilitates reappraisal and improves temporary working memory capacity if the individuals felt negative emotions during the test situation. Short benefits-focused writing is another effective intervention for managing negative emotions during test situations; this strategy could alleviate younger people’s test anxiety. However short expressive writing is not necessarily usually effective for handling negative emotions, could be effective under some conditions. Future studies are necessary to identifying these specific conditions, including age, context, task types, and instances of anxiety.
Keywords
test anxiety
working memory
emotinal regulation
expressive writing
テスト不安
ワーキングメモリ
感情制御
筆記開示
NDC
Education [ 370 ]
Language
jpn
Resource Type departmental bulletin paper
Publisher
広島大学大学院教育学研究科
Date of Issued 2018-12-21
Publish Type Version of Record
Access Rights open access
Source Identifier
[ISSN] 1346-5562
[NCID] AA11625039