Kondo Effect in CeXc (Xc=S, Se, Te) Studied by Electrical Resistivity Measurements under High Pressure

Journal of the Physical Society of Japan 85 巻 3 号 034704-1-034704-7 頁 2016 発行
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タイトル ( eng )
Kondo Effect in CeXc (Xc=S, Se, Te) Studied by Electrical Resistivity Measurements under High Pressure
作成者
Hayashi Yuya
Takai Shun
Matsubayashi Kazuyuki
Uwatoko Yoshiya
Ochiai Akira
収録物名
Journal of the Physical Society of Japan
85
3
開始ページ 034704-1
終了ページ 034704-7
抄録
We have measured the electrical resistivity of cerium monochalcogenides, CeS, CeSe, and CeTe, under high pressures of up to 8 GPa. The pressure dependences of the antiferromagnetic ordering temperature TN, crystal field splitting, and the ln T anomaly of the Kondo effect have been studied to cover the entire region from the magnetic ordering regime at low pressure to the Fermi liquid regime at high pressure. TN initially increases with increasing pressure, and starts to decrease at high pressure as expected from Doniach’s diagram. Simultaneously, the ln T behavior in the resistivity is enhanced, indicating the enhancement of the Kondo effect by pressure. It is also characteristic of CeXc that the crystal field splitting rapidly decreases at a common rate of -12:2 K/GPa. This leads to the increase in the degeneracy of the f state and the further enhancement of the Kondo effect. It is shown that the pressure-dependent degeneracy of the f state is a key factor for understanding the pressure dependence of TN, the Kondo effect, magnetoresistance, and the peak structure in the temperature dependence of resistivity.
内容記述
This work was supported by JSPS KAKENHI Grant Numbers 2430087 and 15K05175.
NDC分類
物理学 [ 420 ]
言語
英語
資源タイプ 学術雑誌論文
出版者
The Physical Society of Japan
一般社団法人日本物理学会
発行日 2016
権利情報
Copyright (c) 2016 The Physical Society of Japan
Copyright (c) 2016 一般社団法人日本物理学会
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
出版タイプ Author’s Original(十分な品質であるとして、著者から正式な査読に提出される版)
アクセス権 オープンアクセス
収録物識別子
[ISSN] 0031-9015
[NCID] AA00704814
[DOI] 10.7566/JPSJ.85.034704
[DOI] http://dx.doi.org/10.7566/JPSJ.85.034704