Cross-sectional optimization of whispering-gallery mode sensor with high electric field intensity in the detection domain
IEEE Journal of Selected Topics in Quantum Electronics Volume 20 Issue 6
Page 1-10
published_at 2014-05-05
アクセス数 : 941 件
ダウンロード数 : 191 件
今月のアクセス数 : 1 件
今月のダウンロード数 : 1 件
この文献の参照には次のURLをご利用ください : https://ir.lib.hiroshima-u.ac.jp/00035689
File |
JSTQE_20-6_1.pdf
2.01 MB
種類 :
fulltext
|
Title ( eng ) |
Cross-sectional optimization of whispering-gallery mode sensor with high electric field intensity in the detection domain
|
Creator |
Haraguchi Masanobu
Okamoto Toshihiro
|
Source Title |
IEEE Journal of Selected Topics in Quantum Electronics
|
Volume | 20 |
Issue | 6 |
Start Page | 1 |
End Page | 10 |
Abstract |
Optimal cross-sectional shapes for whisperinggallery mode sensors with prescribed emission wavelengths and resonance modes are generated through topology optimization based on the finite element method. The sensor is assumed to detect the state of the domain surrounded by the sensor. We identified the integral of the square of the electric field intensity over the detection domain and the quality factor (Q factor), which should be maximized, as key values for the sensor sensitivity, representing the detection limit for the relative permittivity change of the test object. Based on this, the integral of the square of the electric field intensity over the detection domain and the Q factor are studied as the optimization targets. In our numerical study, their optimal configuration characteristics are identified and analyzed. The resulting device has a small radius, a small detection domain and a concave shape with a center located next to the detection domain. We also succeeded in performing simultaneous optimization of the integral of the square of the electric field intensity over the detection domain and the Q factor.
|
NDC |
Electrical engineering [ 540 ]
|
Language |
eng
|
Resource Type | journal article |
Publisher |
IEEE
|
Date of Issued | 2014-05-05 |
Rights |
(c) 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
|
Publish Type | Author’s Original |
Access Rights | open access |
Source Identifier |
[ISSN] 1077-260X
[DOI] 10.1109/JSTQE.2014.2321732
[NCID] AA11036333
[DOI] http://dx.doi.org/10.1109/JSTQE.2014.2321732
|