Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains
Journal of Applied Physics 111 巻 3 号
033525- 頁
2012 発行
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| ファイル情報(添付) | |
| タイトル ( eng ) |
Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains
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| 作成者 |
Williams Jesse R.
Píš Igor
Kobata Masaaki
Winkelmann Aimo
Matsushita Tomohiro
Adachi Yutaka
Ohashi Naoki
Kobayashi Keisuke
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| 収録物名 |
Journal of Applied Physics
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| 巻 | 111 |
| 号 | 3 |
| 開始ページ | 033525 |
| 抄録 |
X ray photoelectron diffraction (XPD) patterns of polar zinc oxide (ZnO) surfaces were investigated experimentally using hard x rays and monochromatized Cr Kα radiation and theoretically using a cluster model approach and a dynamical Bloch wave approach. We focused on photoelectrons emitted from the Zn 2p3/2 and O 1s orbitals in the analysis. The obtained XPD patterns for the (0001) and (000) surfaces of a ZnO single crystal were distinct for a given emitter and polarity. Polarity determination of c-axis-textured polycrystalline ZnO thin films was also achieved with the concept of XPD, even though the in-plane orientation of the columnar ZnO grains was random.
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| NDC分類 |
物理学 [ 420 ]
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| 言語 |
英語
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| 資源タイプ | 学術雑誌論文 |
| 出版者 |
American Institute of Physics
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| 発行日 | 2012 |
| 権利情報 |
(c) 2012 American Institute of Physics
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| 出版タイプ | Version of Record（出版社版。早期公開を含む） |
| アクセス権 | オープンアクセス |
| 収録物識別子 |
[ISSN] 0021-8979
[DOI] 10.1063/1.3682088
[NCID] AA00693547
[DOI] http://dx.doi.org/10.1063/1.3682088
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