Abstract / p2
Contents / p4
1 Introduction / p1
　1.1 Negative Differential Conductivity(NDC) / p2
　1.2 Gunn effect / p3
　1.3 Gunn effect with impact ionization / p6
　1.4 Recombination instability / p7
　1.5 Chaos in semiconductors / p8
　1.6 Composition of following chapters / p9
2 Chaotic current oscillations in the Gunn-effect device under the dc and the rf bias voltages / p13
　2.1 Introduction / p13
　2.2 Equations of motion and the method of solution / p14
　2.3 The motion under the dc bias voltage / p18
　2.4 The motion under the dc and rf bias voltage / p20
3 Non-periodic current oscillations in the Gunn-effect device with the impact-ionization effect / p33
　3.1 Introduction / p33
　3.2 Equations of motion and the method of solution / p34
　3.3 Simulational results / p38
4 Current oscillations induced by recombination instability in semiconductors / p49
　4.1 Introduction / p49
　4.2 Equations of motion and simulation method / p49
　4.3 Simulational results / p54
5 Summary and conclusion / p71