Effects of large threshold corrections in supersymmetric type-I seesaw model
Journal of High Energy Physics Volume 2010 Issue 11
Page 1-28
published_at 2010-11
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Title ( eng ) |
Effects of large threshold corrections in supersymmetric type-I seesaw model
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Creator |
Kang Sin Kyu
Yokozaki Norimi
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Source Title |
Journal of High Energy Physics
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Volume | 2010 |
Issue | 11 |
Start Page | 1 |
End Page | 28 |
Abstract |
We investigate lepton flavor violating (LFV) radiative processes and the relic abundance of neutralino dark matter in supersymmetric type-I seesaw model. We carefully derive threshold corrections to the flavor off-diagonal elements of slepton mass matrix and up-type Higgs mass squared and find that they can be large in the case of large B-N(0). We examine how the branching ratios of LFV radiative decays and the relic abundance of neutralino dark matter can be significantly affected by the large threshold corrections. Soft scalar mass squared parameter of up-type Higgs scalar is also affected by the threshold corrections. Since the higgsino mass depends on the mass parameter for up-type Higgs, the LFV processes and the relic abundance of the neutralino dark matter are correlated with each other. We show that there are parameter regions where the predictions of the relic abundance of neutralino dark matter are consistent with WMAP observation and the branching ratios of LFV radiative decays are predicted to be testable in future experiments. We find that the masses of scalar supersymmetric particles are not necessarily small so that the branching ratios of LFV decays can be testable in future experiment, which is distinctive feature of this scenario.
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Keywords |
Supersymmetry Phenomenology
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NDC |
Physics [ 420 ]
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Language |
eng
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Resource Type | journal article |
Publisher |
Springer
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Date of Issued | 2010-11 |
Rights |
(c) SISSA 2010
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Publish Type | Author’s Original |
Access Rights | open access |
Source Identifier |
The original publication is available at www.springerlink.com
[ISSN] 1126-6708
[DOI] 10.1007/JHEP11(2010)061
[NCID] AA11380940
[DOI] http://dx.doi.org/10.1007/JHEP11(2010)061
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