Polarimetric performance of Si/CdTe semiconductor Compton camera
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment Volume 622 Issue 3
Page 619-627
published_at 2010-10-21
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| File | |
| Title ( eng ) |
Polarimetric performance of Si/CdTe semiconductor Compton camera
|
| Creator |
Takeda Shin'ichiro
Odaka Hirokazu
Katsuta Junichiro
Ishikawa Shin-nosuke
Sugimoto So-ichiro
Koseki Yuu
Watanabe Shin
Sato Goro
Kokubun Motohide
Takahashi Tadayuki
Nakazawa Kazuhiro
Tajima Hiroyasu
Toyokawa Hidenori
|
| Source Title |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
|
| Volume | 622 |
| Issue | 3 |
| Start Page | 619 |
| End Page | 627 |
| Abstract |
A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and gamma-ray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized gamma-rays at SPring-8.
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| Keywords |
Gamma-ray astronomy
Compton camera
Polarimeter
|
| NDC |
Astronomy. Space sciences [ 440 ]
|
| Language |
eng
|
| Resource Type | journal article |
| Publisher |
Elsevier Science BV
|
| Date of Issued | 2010-10-21 |
| Rights |
Copyright (c) 2010 Elsevier B.V.
|
| Publish Type | Author’s Original |
| Access Rights | open access |
| Source Identifier |
[ISSN] 0168-9002
[DOI] 10.1016/j.nima.2010.07.077
[NCID] AA10529991
[DOI] http://dx.doi.org/10.1016/j.nima.2010.07.077
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