Particle size measurement of standard reference particle candidates and theoretical estimation of uncertainty region

Advanced Powder Technology Volume 20 Issue 2 Page 145-149 published_at 2009
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Title ( eng )
Particle size measurement of standard reference particle candidates and theoretical estimation of uncertainty region
Creator
Mori Yasushige
Masuda Hiroaki
Source Title
Advanced Powder Technology
Volume 20
Issue 2
Start Page 145
End Page 149
Abstract
In order to confirm reliable particle size measurement technique and to prepare standard reference particles for calibrating particle size measurement devices, experimental and theoretical studies have been conducted about particle size measurement of 0.1-1 mu m silica particles. The microscopic method with sample size greater than 90,000 particles was conducted for the size measurement. Theoretical equation of uncertainty region over all particle diameter range is newly proposed and compared with computer simulation. Previous paper [H. Masuda, K. Iinoya, Theoretical study of the scatter of experimental data due to particle size distribution, J. Chem. Eng. 4(l) (1971) 60-67] reported the uncertainty region only for mass median diameter, but this paper presents the uncertainty region for all particle size range. The uncertainty region increases with the increase in particle diameter and also increases as the sample size decreases. Theoretical uncertainty region agreed with the results of computer simulation.
Keywords
Particle size
Standard reference particle
Uncertainty region
Log-normal distribution
Size measurement
Computer simulation
NDC
Chemical technology [ 570 ]
Language
eng
Resource Type journal article
Publisher
Elsevier Science Bv
Date of Issued 2009
Rights
Copyright (c) 2008 The Society of Powder Technology Japan. Published by Elsevier BV and The Society of Powder Technology Japan. Published by Elsevier B.V.
Publish Type Author’s Original
Access Rights open access
Source Identifier
[ISSN] 0921-8831
[DOI] 10.1016/j.apt.2008.05.002
[NCID] AA1074214X
[DOI] http://dx.doi.org/10.1016/j.apt.2008.05.002