Electron-ion-ion triple-coincidence spectroscopic study of site-specific fragmentation caused by Si:2p core-level photoionization of F3SiCH2CH2Si(CH3)3 vapor

Physical Review A - Atomic, Molecular, and Optical Physics 75 巻 2 号 020502-1-020502-4 頁 2007-02-20 発行
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タイトル ( eng )
Electron-ion-ion triple-coincidence spectroscopic study of site-specific fragmentation caused by Si:2p core-level photoionization of F3SiCH2CH2Si(CH3)3 vapor
作成者
Nagaoka Shin-ichi
Prümper Georg
Fukuzawa Hironobu
Hino Megumi
Takemoto Mai
Tamenori Yusuke
Harries James
Suzuki Isao H.
Tabayashi Kiyohiko
Liu Xiao-Jing
Lischke Toralf
Ueda Kiyoshi
収録物名
Physical Review A - Atomic, Molecular, and Optical Physics
75
2
開始ページ 020502-1
終了ページ 020502-4
抄録
Site-specific fragmentation caused by Si:2p core-level photoionization of F3SiCH2CH2Si(CH3)3 vapor was studied by means of high-resolution energy-selected-electron photoion-photoion triple-coincidence spectroscopy. The ab initio molecular orbital method was used for the theoretical description. F3SiCH2CH2+- Si(CH3)3+ ion pairs were produced by the 2p photoionization of the Si atoms bonded to the three methyl groups, and SiF+-containing ion pairs were produced by the 2p photoionization of the Si atoms bonded to the three F atoms.
言語
英語
資源タイプ 学術雑誌論文
出版者
American Physical Society
発行日 2007-02-20
権利情報
Copyright (c) 2007 The American Physical Society.
出版タイプ Version of Record(出版社版。早期公開を含む)
アクセス権 オープンアクセス
収録物識別子
[ISSN] 1050-2947
[DOI] 10.1103/PhysRevA.75.020502
[NCID] AA10764867
[DOI] http://dx.doi.org/10.1103/PhysRevA.75.020502