Core-level x-ray photoemission on NiO in the impurity limit
Physical Review B - Condensed Matter and Materials Physics 61 巻 20 号
13 403-13 409 頁
2000-05-15 発行
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PhysRevB_61_13403.pdf
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タイトル ( eng ) |
Core-level x-ray photoemission on NiO in the impurity limit
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作成者 |
Altieri S.
Tjeng L. H.
Sawatzky G. A.
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収録物名 |
Physical Review B - Condensed Matter and Materials Physics
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巻 | 61 |
号 | 20 |
開始ページ | 13 403 |
終了ページ | 13 409 |
抄録 |
We present a core level X-ray photoelectron spectroscopy study of NixMg12xO crystals with 0.03<x<1. We show that nonlocal effects involving inter-Ni-site fluctuations strongly influence the Ni 2p core-level spectra for higher Ni concentrations including NiO itself. It is only in the very dilute Ni limit that the core-level spectra can be described in terms of an Anderson impurity model which also must include a realistic band structure for the O 2p. Moreover, it is only in this limit that a single-site model can explain the core-level and valence-band spectra as well as the optical data by using one consistent set of parameter values. These results consolidate the concepts of nonlocal screening and provide a better understanding of the electronic structure of NiO.
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言語 |
英語
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資源タイプ | 学術雑誌論文 |
出版者 |
American Physical Society
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発行日 | 2000-05-15 |
権利情報 |
Copyright (c) 2000 American Physical Society.
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出版タイプ | Version of Record(出版社版。早期公開を含む) |
アクセス権 | オープンアクセス |
収録物識別子 |
[ISSN] 1098-0121
[DOI] 10.1103/PhysRevB.61.13403
[NCID] AA11187113
[DOI] http://dx.doi.org/10.1103/PhysRevB.61.13403
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