High-pressure Raman study of the iodine-doped silicon clathrate I8Si44I2
Physical Review B - Condensed Matter and Materials Physics Volume 68 Issue 21
Page 2121021-
published_at 2003-12
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Title ( eng ) |
High-pressure Raman study of the iodine-doped silicon clathrate I8Si44I2
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Creator |
Shimizu Hiroyasu
Kume Tetsuji
Kubota Toyoki
Sasaki Shingo
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Source Title |
Physical Review B - Condensed Matter and Materials Physics
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Volume | 68 |
Issue | 21 |
Start Page | 2121021 |
Abstract |
Raman scattering measurements of an iodine-doped I8Si44I2 clathrate have been performed at pressures up to 28 GPa and 296 K. We found two Raman peaks at 75 and 101 cm-1 associated with the vibrations of guest I atoms inside the host Si cages, and observed some framework vibrations around 120–500 cm-1. These characteristic Raman bands and their pressure dependence are investigated in consideration of our recent Ba8Si46 studies. The lowest-frequency framework vibration at 133 cm-1 shows the softening with pressure, which seems to be the common feature of Si clathrates. A strong and broad Raman band centered at 461 cm-1 is identified to the highest-frequency framework vibration, which is likely intensified and broadened by the considerable framework distortion due to the replacement of framework Si with larger I atom. No obvious pressure-induced phase transition was found up to 28 GPa. The guest-host interactions are investigated by the present vibrational properties and are compared with those of previous neutron studies of I8Si44I2.
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NDC |
Physics [ 420 ]
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Language |
eng
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Resource Type | journal article |
Publisher |
American Physical Society
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Date of Issued | 2003-12 |
Rights |
Copyright (c) 2003 American Physical Society
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Publish Type | Version of Record |
Access Rights | open access |
Source Identifier |
[NCID] AA11187113
[ISSN] 1098-0121
[DOI] 10.1103/PhysRevB.68.212102
[DOI] http://dx.doi.org/10.1103/PhysRevB.68.212102
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