Comparison of Properties of Slow Pathway Potential between Successful and Unsuccessful Radiofrequency Applications in Patients who Underwent Catheter Ablation for Atrioventricular Nodal Reentrant Tachycardia

Hirao Hidekazu

Muraoka Yuji

Yamagata Togo

Matsuura Hideo

Kajiyama Goro

Hiroshima Journal of Medical Sciences

[PISSN] 0018-2052

[EISSN] 2433-7668

[NCID] AA00664312

Findings concerning selective slow pathway radiofrequency ablation for atrioventricular nodal reentrant tachycardia (A VNRT) using the slow pathway potential (SPP) guided method are reported. The electrogram at the SPP recording site showed double potentials consisting of the atrial potential (A) and SPP. However, SPP is usually recorded widely in the right atrial posteroseptal region. To examine whether there was any characteristic marker in the electrogram at the SPP recording site specific to successful RF application, the properties of SPP and its anatomical locations in both successful (S) (38 sites) and unsuccessful (UN) (28 sites) application sites were analyzed in 38 patients who underwent SPP-guided ablation. The distance between the upper margin of the coronary sinus ostium (UCSO) and the ablation catheter (ABL) (DUCSO-ABL) was shorter in S than in UN (2.3 ± 6.3 mm vs. 9.0 ± 5.2 mm below the level of UCSO, p < 0.001). The interval between A and SPP (A-SPP) was longer in S than in UN (44.2 ± 9.9 msec vs. 24.0 ± 7.0 msec, p < 0.001). RF applications at the more anterior sites with longer A-SPP were more successful than at other sites. The sensitivity and specificity of A-SPP (more than 40 msec) were superior to those of DUCSO-ABL (within 5 mm) as the marker for the successful application (sensitivity; 73.7% v.s. 68.4%, specificity; 100% v.s. 82.1 %, respectively). In conclusion, the sites with longer A-SPP might be specific for successful ablation.

Atrioventricular nodal reentrant tachycardia

Radiofrequency catheter ablation

Slow pathway potential

Upper margin of coronary sinus ostium

医学 [ 490 ]

英語

Hiroshima University Medical Press

[ISSN] 0018-2052

[NCID] AA00664312