Dynamical behavior of voids in neutron-irradiated copper at elevated temperature
Materials Research Society Symposium - Proceedings Volume 650
Page R3.11.1-R3.11.6
published_at 2001
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Title ( eng ) |
Dynamical behavior of voids in neutron-irradiated copper at elevated temperature
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Creator |
Shimomura Yoshiharu
Mukouda Ichiro
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Source Title |
Materials Research Society Symposium - Proceedings
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Volume | 650 |
Start Page | R3.11.1 |
End Page | R3.11.6 |
Abstract |
We reported previously an experimental result which shows that voids can move in neutron-irradiated copper at elevated temperature. To study the detailed behavior of voids, we carried out the annealing experiments and in-situ observation in neutron-irradiated copper. Neutron irradiation was carried out in the temperature controlled capsule at KUR (Kyoto University Reactor). Neutron irradiation was performed at 300oC to damage level between 10-4 to 10-3 dpa. Annealing temperature was 250oC for 10, 20, 30 min sequentially for neutron- irradiated copper, after annealing TEM observation was carried out at room temperature. Experimental results show that void moved along [110] direction. Voids were moved during 250oC annealing but SFTs were not changed. We observed 37 voids and 8 voids were moved, the others vanished during annealing. The images of in-situ observation, void contrast images were recorded on VTR tape and analyzed by frame. At room temperature observation voids were static and white circle, however at 300oC in-situ observation contrast were changed like an oval and sometimes contrast was disappear. After 7 sec contrast was white circle and moved slightly and similar phenomena were observed quite frequently at 300oC. It is concluded that void moved with dynamical structural relaxation at elevated temperature.
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Language |
eng
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Resource Type | journal article |
Publisher |
Materials Research Society
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Date of Issued | 2001 |
Rights |
Copyright (c) 2001 Materials Research Society.
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Publish Type | Author’s Original |
Access Rights | open access |
Source Identifier |
[ISSN] 0272-9172
[NCID] BA53584752
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