Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains
Journal of Applied Physics Volume 111 Issue 3
Page 033525-
published_at 2012
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| File | |
| Title ( eng ) |
Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains
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| Creator |
Williams Jesse R.
Píš Igor
Kobata Masaaki
Winkelmann Aimo
Matsushita Tomohiro
Adachi Yutaka
Ohashi Naoki
Kobayashi Keisuke
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| Source Title |
Journal of Applied Physics
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| Volume | 111 |
| Issue | 3 |
| Start Page | 033525 |
| Abstract |
X ray photoelectron diffraction (XPD) patterns of polar zinc oxide (ZnO) surfaces were investigated experimentally using hard x rays and monochromatized Cr Kα radiation and theoretically using a cluster model approach and a dynamical Bloch wave approach. We focused on photoelectrons emitted from the Zn 2p3/2 and O 1s orbitals in the analysis. The obtained XPD patterns for the (0001) and (000) surfaces of a ZnO single crystal were distinct for a given emitter and polarity. Polarity determination of c-axis-textured polycrystalline ZnO thin films was also achieved with the concept of XPD, even though the in-plane orientation of the columnar ZnO grains was random.
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| NDC |
Physics [ 420 ]
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| Language |
eng
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| Resource Type | journal article |
| Publisher |
American Institute of Physics
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| Date of Issued | 2012 |
| Rights |
(c) 2012 American Institute of Physics
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| Publish Type | Version of Record |
| Access Rights | open access |
| Source Identifier |
[ISSN] 0021-8979
[DOI] 10.1063/1.3682088
[NCID] AA00693547
[DOI] http://dx.doi.org/10.1063/1.3682088
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