Conduction mechanism of Si single-electron transistor having a one-dimensional regular array of multiple tunnel junctions
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ID | 18591 |
本文ファイル | |
著者 |
Ito, Yuhei
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抄録(英) | Uniformly doped Si single-electron transistors consisting of a one-dimensional regular array of multiple tunnel junctions (MTJs) and islands have been fabricated. The Coulomb blockade effect is found to play an important role in carrier conduction in the MTJ system at low temperatures (6 K). The conduction mechanism can be interpreted well by considering soliton. The soliton extends less than three islands in our MTJs, and the energy of a single soliton is found to be 0.024 eV from an analysis of low-temperature current–voltage characteristics. For high-temperature operation, it is effective to reduce the parasitic capacitance of each island, which leads to an increase in soliton length.
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掲載誌名 |
Applied Physics Letters
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巻 | 81巻
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号 | 4号
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開始ページ | 733
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終了ページ | 735
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出版年月日 | 2002-07-22
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出版者 | American Institute of Physics
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ISSN | 0003-6951
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NCID | |
出版者DOI | |
言語 |
英語
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NII資源タイプ |
学術雑誌論文
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広大資料タイプ |
学術雑誌論文
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DCMIタイプ | text
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フォーマット | application/pdf
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著者版フラグ | publisher
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権利情報 | Copyright (c) 2002 American Institute of Physics.
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関連情報URL | |
部局名 |
ナノデバイス・システム研究センター
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