X-ray diffraction measurement of liquid As2Se3 by using third-generation synchrotron radiation source

Journal of Non-Crystalline Solids 353 巻 18-21 号 1985-1989 頁 2007-06-15 発行
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タイトル ( eng )
X-ray diffraction measurement of liquid As2Se3 by using third-generation synchrotron radiation source
作成者
Matsuda Kazuhiro
Tamura Kozaburo
Hosokawa Shinya
収録物名
Journal of Non-Crystalline Solids
353
18-21
開始ページ 1985
終了ページ 1989
抄録
X-ray diffraction (XD) measurements of liquid As2Se3 were carried out in the temperature range up to 1600◦C where the temperature is well beyond the semiconductor to metal (SC-M) transition temperature around 1000◦C . The measurements were done by using third-generation synchrotron radiation source at SPring-8 and the obtained structure factors have much improvements over the previous XD measurements by using in house X-ray sources with regard to the momentum transfer range and the data statistics. The deduced pair distribution functions show that with increasing temperature, the the position of the first peak does not change within the errorbar and the coordination number gradually decreases up to 1600◦C irrespective of the SC-M transition. These results contradict previous in house XD measurement but coincide with the first principle molecular dynamics simulation.
著者キーワード
X-ray diffraction
Glass melting
Short-range order
NDC分類
物理学 [ 420 ]
言語
英語
資源タイプ 学術雑誌論文
出版者
Elsevier Science B.V.
発行日 2007-06-15
権利情報
Copyright (c) 2007 Elsevier B.V.
出版タイプ Author’s Original(十分な品質であるとして、著者から正式な査読に提出される版)
アクセス権 オープンアクセス
収録物識別子
[ISSN] 0022-3093
[DOI] 10.1016/j.jnoncrysol.2007.01.062
[NCID] AA00703560
[DOI] http://dx.doi.org/10.1016/j.jnoncrysol.2007.01.062