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ID 46737
file
creator
Panaccione, Giancarlo
Kobayashi, Keisuke
subject
Hard X-ray Photoelectron Spectroscopy
Bulk properties
NDC
Physics
abstract
The electronic properties of surfaces and buried interfaces can vary considerably in comparison to the bulk. In turn, analyzing bulk properties, without including those of the surface, is understandably challenging. Hard X-ray photoelectron spectroscopy (HAXPES) allows the well known ability of photoemission to interrogate the electronic structure of material systems with bulk volume sensitivity. This is achieved by tuning the kinetic energy range of the analyzed photoelectrons in the multi-keV regime. This unique ability to probe truly bulk properties strongly compliments normal photoemission, which generally probes surface electronic structure that is different than the bulk selected examples of HAXPES and possible implications towards the study of complex oxide-based interfaces and highly correlated systems are discussed.
description
This work has been supported in part by CNR-INFM. The research leading to these results has received funding from the FP72007-2013 framework programme under grant NMP3-LA-2010-246102. Development of HARP Lab systems has been supported by SENTAN, JST.
journal title
Surface Science
volume
Volume 606
issue
Issue 3-4
start page
125
end page
129
date of issued
2011-11
publisher
Elsevier B.V.
issn
0039-6028
ncid
publisher doi
language
eng
nii type
Journal Article
HU type
Journal Articles
DCMI type
text
format
application/pdf
text version
author
rights
Copyright (c) 2011 Elsevier B.V.
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
relation url
department
Hiroshima Synchrotron Radiation Center