Polarimetric performance of Si/CdTe semiconductor Compton camera
Use this link to cite this item : https://ir.lib.hiroshima-u.ac.jp/00030792
| ID | 30792 |
| file | |
| creator |
Takeda, Shin'ichiro
Odaka, Hirokazu
Katsuta, Junichiro
Ishikawa, Shin-nosuke
Sugimoto, So-ichiro
Koseki, Yuu
Watanabe, Shin
Sato, Goro
Kokubun, Motohide
Takahashi, Tadayuki
Nakazawa, Kazuhiro
Tajima, Hiroyasu
Toyokawa, Hidenori
|
| subject | Gamma-ray astronomy
Compton camera
Polarimeter
|
| NDC |
Astronomy. Space sciences
|
| abstract | A Compton camera has been developed based on Si and CdTe semiconductor detectors with high spatial and spectral resolution for hard X- and gamma-ray astrophysics applications. A semiconductor Compton camera is also an excellent polarimeter due to its capability to precisely measure the Compton scattering azimuth angle, which is modulated by linear polarization. We assembled a prototype Compton camera and conducted a beam test using nearly 100% linearly polarized gamma-rays at SPring-8.
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| journal title |
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
|
| volume | Volume 622
|
| issue | Issue 3
|
| start page | 619
|
| end page | 627
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| date of issued | 2010-10-21
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| publisher | Elsevier Science BV
|
| issn | 0168-9002
|
| ncid | |
| publisher doi | |
| language |
eng
|
| nii type |
Journal Article
|
| HU type |
Journal Articles
|
| DCMI type | text
|
| format | application/pdf
|
| text version | author
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| rights | Copyright (c) 2010 Elsevier B.V.
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| relation url | |
| department |
Graduate School of Science
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