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ID 20631
file
creator
Matsuda, Kazuhiro
Tamura, Kozaburo
Hosokawa, Shinya
subject
X-ray diffraction
Glass melting
Short-range order
NDC
Physics
abstract
X-ray diffraction (XD) measurements of liquid As2Se3 were carried out in the temperature range up to 1600◦C where the temperature is well beyond the semiconductor to metal (SC-M) transition temperature around 1000◦C . The measurements were done by using third-generation synchrotron radiation source at SPring-8 and the obtained structure factors have much improvements over the previous XD measurements by using in house X-ray sources with regard to the momentum transfer range and the data statistics. The deduced pair distribution functions show that with increasing temperature, the the position of the first peak does not change within the errorbar and the coordination number gradually decreases up to 1600◦C irrespective of the SC-M transition. These results contradict previous in house XD measurement but coincide with the first principle molecular dynamics simulation.
journal title
Journal of Non-Crystalline Solids
volume
Volume 353
issue
Issue 18-21
start page
1985
end page
1989
date of issued
2007-06-15
publisher
Elsevier Science B.V.
issn
0022-3093
ncid
publisher doi
language
eng
nii type
Journal Article
HU type
Journal Articles
DCMI type
text
format
application/pdf
text version
author
rights
Copyright (c) 2007 Elsevier B.V.
relation url
department
Graduate School of Integrated Arts and Sciences