X-ray diffraction measurement of liquid As2Se3 by using third-generation synchrotron radiation source
X-ray diffraction (XD) measurements of liquid As2Se3 were carried out in the temperature range up to 1600◦C where the temperature is well beyond the semiconductor to metal (SC-M) transition temperature around 1000◦C . The measurements were done by using third-generation synchrotron radiation source at SPring-8 and the obtained structure factors have much improvements over the previous XD measurements by using in house X-ray sources with regard to the momentum transfer range and the data statistics. The deduced pair distribution functions show that with increasing temperature, the the position of the first peak does not change within the errorbar and the coordination number gradually decreases up to 1600◦C irrespective of the SC-M transition. These results contradict previous in house XD measurement but coincide with the first principle molecular dynamics simulation.
Journal of Non-Crystalline Solids
|date of issued||
Elsevier Science B.V.
Copyright (c) 2007 Elsevier B.V.
Graduate School of Integrated Arts and Sciences
Last 12 months's access : ? times
Last 12 months's DL: ? times
This month's access: ? times
This month's DL: ? times