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ID 18827
file
creator
Takase, Kouichi
Sato, Ken
Shoji, Osamu
Takano, Yoshiki
Sekizawa, Kazuko
Goto, Manabu
abstract
The charge density distributions of layered oxysulfide (LaO)CuS, known as a p-type transparent semiconductor, have been investigated by analyzing the synchrotron radiation powder diffraction profile with the maximum entropy method/Rietveld method. The bonding character of the Cu–S bond is revealed to be covalent. Meanwhile, the O–La bonding has both ionic and covalent characters. The number of electrons estimated by integrating the charge density around each atom gave direct evidence that each CuS and LaO layer is electrically almost neutral.
journal title
Applied Physics Letters
volume
Volume 90
issue
Issue 16
start page
161916-1
end page
161916-3
date of issued
2007-04-19
publisher
American Institute of Physics
issn
0003-6951
ncid
publisher doi
language
eng
nii type
Journal Article
HU type
Journal Articles
DCMI type
text
format
application/pdf
text version
publisher
rights
Copyright (c) 2007 American Institute of Physics.
relation url
department
Graduate School of Science



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