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ID 46737
本文ファイル
著者
Panaccione, Giancarlo
Kobayashi, Keisuke
キーワード
Hard X-ray Photoelectron Spectroscopy
Bulk properties
NDC
物理学
抄録(英)
The electronic properties of surfaces and buried interfaces can vary considerably in comparison to the bulk. In turn, analyzing bulk properties, without including those of the surface, is understandably challenging. Hard X-ray photoelectron spectroscopy (HAXPES) allows the well known ability of photoemission to interrogate the electronic structure of material systems with bulk volume sensitivity. This is achieved by tuning the kinetic energy range of the analyzed photoelectrons in the multi-keV regime. This unique ability to probe truly bulk properties strongly compliments normal photoemission, which generally probes surface electronic structure that is different than the bulk selected examples of HAXPES and possible implications towards the study of complex oxide-based interfaces and highly correlated systems are discussed.
内容記述
This work has been supported in part by CNR-INFM. The research leading to these results has received funding from the FP72007-2013 framework programme under grant NMP3-LA-2010-246102. Development of HARP Lab systems has been supported by SENTAN, JST.
掲載誌名
Surface Science
606巻
3-4号
開始ページ
125
終了ページ
129
出版年月日
2011-11
出版者
Elsevier B.V.
ISSN
0039-6028
NCID
出版者DOI
言語
英語
NII資源タイプ
学術雑誌論文
広大資料タイプ
学術雑誌論文
DCMIタイプ
text
フォーマット
application/pdf
著者版フラグ
author
権利情報
Copyright (c) 2011 Elsevier B.V.
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
関連情報URL
部局名
放射光科学研究センター