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ID 26516
本文ファイル
著者
Tamura, Kozaburo
Oh'ishi, Yasufumi
Nakaso, Ichiro
Funakoshi, Ken-ichi
Utsumi, Wataru
NDC
物理学
抄録(英)
X-ray diffraction measurements at temperatures up to 1500C and pressures up to 843 bar have been carried out using synchrotron radiation at SPring-8 to investigate structural change in the semiconductor-to-metal transition in expanded fluid-Se. The signal-to-noise ratio in the intensity spectra was better than the previous one using in-house X-ray source. It is found important to estimate the background from a sapphire cell to deduce a structure factor of fluid Se with greater accuracy from the spectra. The preservation of the twofold coordinated chain structure and the contraction of the covalent bond are reconfirmed in the transition. When metallic properties were increased, the first peak in the pair distribution function became asymmetric towards larger distance and the first minimum became larger. These results may imply the modification on the chain structure in the transition.
掲載誌名
Journal of Non-Crystalline Solids
250-252巻
2号
開始ページ
519
終了ページ
524
出版年月日
1999-08-01
出版者
Elsevier Science B.V.
ISSN
0022-3093
NCID
出版者DOI
言語
英語
NII資源タイプ
学術雑誌論文
広大資料タイプ
学術雑誌論文
DCMIタイプ
text
フォーマット
application/pdf
著者版フラグ
author
権利情報
Copyright (c) 1999 Elsevier Science B.V. All rights reserved.
関連情報URL
部局名
総合科学研究科