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ID 46326
本文ファイル
著者
Wunnasri, Warunya
Pailai, Jaruwat
Hayashi, Yusuke 大学院工学研究科 広大研究者総覧
Hirashima, Tsukasa 大学院工学研究科 広大研究者総覧
キーワード
Concept map assessment method
Kit-Build concept map
Reliability
NDC
教育
抄録(英)
This paper describes an investigation into the reliability of an automatic assessment method of the learner-build concept map by comparing it with two well-known manual methods. We have previously proposed the Kit-Build (KB) concept map framework where a learner builds a concept map by using only a provided set of components, known as the set "kit". In this framework, instant and automatic assessment of a learner-build concept map has been realized. We call this assessment method the "Kit-Build method" (KB method). The framework and assessment method have already been practically used in classrooms in various schools. As an investigation of the reliability of this method, we have conducted an experiment to compare the assessment results of the method with the assessment results of two other manual assessment methods. In this experiment, 22 university students attended as subjects and four as raters. It was found that the scores of the KB method had a very strong correlation with the scores of the other manual methods. The results suggest that automatic assessment of the Kit-Build concept map can attain almost the same level of reliability as well-known manual assessment methods.
内容記述
'Artificial Intelligence in Education' 18th International Conference, AIED 2017, Wuhan, China, June 28 – July 1, 2017, Proceedings
掲載誌名
Lecture Notes in Computer Science
10331巻
開始ページ
418
終了ページ
429
出版年月日
2017
出版者
Springer, Cham
ISSN
0302-9743
1611-3349
ISBN
978-3-319-61424-3
978-3-319-61425-0
出版者DOI
言語
英語
NII資源タイプ
会議発表論文
広大資料タイプ
会議発表論文
DCMIタイプ
text
フォーマット
application/pdf
著者版フラグ
author
権利情報
The final authenticated version is available online at https://doi.org/10.1007/978-3-319-61425-0_35.
This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
部局名
工学研究科