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ID 20631
本文ファイル
著者
Matsuda, Kazuhiro
Tamura, Kozaburo
Hosokawa, Shinya
キーワード
X-ray diffraction
Glass melting
Short-range order
NDC
物理学
抄録(英)
X-ray diffraction (XD) measurements of liquid As2Se3 were carried out in the temperature range up to 1600◦C where the temperature is well beyond the semiconductor to metal (SC-M) transition temperature around 1000◦C . The measurements were done by using third-generation synchrotron radiation source at SPring-8 and the obtained structure factors have much improvements over the previous XD measurements by using in house X-ray sources with regard to the momentum transfer range and the data statistics. The deduced pair distribution functions show that with increasing temperature, the the position of the first peak does not change within the errorbar and the coordination number gradually decreases up to 1600◦C irrespective of the SC-M transition. These results contradict previous in house XD measurement but coincide with the first principle molecular dynamics simulation.
掲載誌名
Journal of Non-Crystalline Solids
353巻
18-21号
開始ページ
1985
終了ページ
1989
出版年月日
2007-06-15
出版者
Elsevier Science B.V.
ISSN
0022-3093
NCID
出版者DOI
言語
英語
NII資源タイプ
学術雑誌論文
広大資料タイプ
学術雑誌論文
DCMIタイプ
text
フォーマット
application/pdf
著者版フラグ
author
権利情報
Copyright (c) 2007 Elsevier B.V.
関連情報URL
部局名
総合科学研究科