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ID 33914
file
creator
Kim, Sunghun
Ye, Mao
Kuroda, Kenta
Yamada, Yohei
Krasovskii, E. E.
Chulkov, E. V.
Ueda, Yoshifumi
NDC
Physics
abstract
We have performed scanning tunneling microscopy and differential tunneling conductance (dI/dV) mapping for the surface of the three-dimensional topological insulator Bi2Se3. The fast Fourier transformation applied to the dI/dV image shows an electron interference pattern near Dirac node despite the general belief that the backscattering is well suppressed in the bulk energy gap region. The comparison of the present experimental result with theoretical surface and bulk band structures shows that the electron interference occurs through the scattering between the surface states near the Dirac node and the bulk continuum states.
journal title
Physical Review Letters
volume
Volume 107
issue
Issue 05
start page
056803
date of issued
2011
publisher
American Physical Society
issn
0031-9007
ncid
publisher doi
language
eng
nii type
Journal Article
HU type
Journal Articles
DCMI type
text
format
application/pdf
text version
publisher
rights
(c) 2011 American Physical Society
relation url
department
Graduate School of Science
Hiroshima Synchrotron Radiation Center